Open AccessSuper resolution methodology based on temperature dependent Raman scattering
Author(s) -
Omer Tzang,
Doron Azoury,
Ori Cheshnovsky
Publication year - 2015
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.017929
Subject(s) - raman scattering , optics , materials science , raman spectroscopy , diffraction , image resolution , microscopy , resolution (logic) , characterization (materials science) , ultrashort pulse , laser , scattering , temporal resolution , spectral resolution , microscope , near and far field , physics , spectral line , astronomy , artificial intelligence , computer science
The recent advances in far-field super-resolution (SR) microscopy rely on, and therefore are limited by the ability to control the fluorescence of label molecules. We suggest a new, label-free, far-field SR microscopy based on temperature dependence of Raman scattering. Here, we present simulation and experimental characterization of the method. In an ultrafast pump-probe scheme, a spatial temperature profile is optically excited throughout the diffraction-limited spot; the Raman spectrum is probed with an overlapping laser. Thermally induced shifts, recorded in a specific spectral region of interest (ROI), enable spatial discrimination between areas of different temperature. Our simulations show spatial resolution that surpasses the diffraction limit by more than a factor of 2. Our method is compatible with material characterization in ambient, vacuum and liquid, thin and thick samples alike.