Open AccessX-ray nanotomography using near-field ptychography
Author(s) -
Marco Stockmar,
Maxime Hubert,
Martin Dierolf,
Bjoern Enders,
Richard Clare,
Sebastian Allner,
Andreas Fehringer,
Irène Zanette,
Julie Villanova,
Jérôme Laurencin,
Peter Cloetens,
Franz Pfeiffer,
Pierre Thibault
Publication year - 2015
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.012720
Subject(s) - ptychography , optics , phase retrieval , tomographic reconstruction , tomography , holography , materials science , image quality , iterative reconstruction , computer science , diffraction , physics , artificial intelligence , fourier transform , quantum mechanics , image (mathematics)
Propagation-based imaging or inline holography in combination with computed tomography (holotomography) is a versatile tool to access a sample's three-dimensional (3D) micro or nano structure. However, the phase retrieval step needed prior to tomographic reconstruction can be challenging especially for strongly absorbing and refracting samples. Near-field ptychography is a recently developed phase imaging method that has been proven to overcome this hurdle in projection data. In this work we extend near-field ptychography to three dimensions and we show that, in combination with tomography, it can access the nano structure of a solid oxide fuel cell (SOFC). The quality of the resulting tomographic data and the structural properties of the anode extracted from this volume were compared to previous results obtained with holotomography. This work highlights the potential of 3D near-field ptychography for reliable and detailed investigations of samples at the nanometer scale, with important applications in materials and life sciences among others.