
Sampling grating approach for X-ray differential phase contrast imaging
Author(s) -
Yang Du,
Xin Liu,
Jianheng Huang,
Yaohu Lei,
Zhigang Zhao,
Danying Lin,
Jr-Hung Guo,
Ji Li,
Hanben Niu
Publication year - 2015
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.012712
Subject(s) - optics , grating , phase contrast imaging , x ray phase contrast imaging , phase (matter) , sampling (signal processing) , contrast (vision) , signal (programming language) , synchrotron radiation , physics , projection (relational algebra) , sensitivity (control systems) , materials science , computer science , detector , phase contrast microscopy , algorithm , electronic engineering , programming language , quantum mechanics , engineering
Grating-based X-ray differential phase contrast imaging (GDPCI) typically employs the phase-stepping technique to extract an object's phase information. This method requires heavy radiation dosage and is time consuming. Another potential approach is the reverse projection (RP) method, which, however, relies on a synchrotron radiation source to obtain highly sensitive differential phase contrast(DPC) signal. Here, we present an alternative approach that enables the RP method to be used with a conventional X-ray source and substantially improves the sensitivity of the DPC signal by replacing the analyzer grating of the GDPCI with a sampling grating. This development represents a significant step towards obtaining fast and low-dosage DPC images in medical, biological, and industrial applications.