Open AccessFocusing and imaging in microsphere-based microscopy
Author(s) -
Thanh Xuan Hoang,
Yubo Duan,
Xudong Chen,
George Barbastathis
Publication year - 2015
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.012337
Subject(s) - optics , diffraction , polarization (electrochemistry) , microscopy , wavelength , microscope , materials science , image resolution , physics , chemistry
Microsphere-based microscopy systems have garnered lots of recent interest, mainly due to their capacity in focusing light and imaging beyond the diffraction limit. In this paper, we present theoretical foundations for studying the optical performance of such systems by developing a complete theoretical model encompassing the aspects of illumination, sample interaction and imaging/collection. Using this model, we show that surface waves play a significant role in focusing and imaging with the microsphere. We also show that by designing a radially polarized convergent beam, we can focus to a spot smaller than the diffraction limit. By exploiting surface waves, we are able to resolve two dipoles spaced 98 nm apart in simulation using light at a wavelength of 402.292 nm. Using our model, we also explore the effect of beam geometry and polarization on optical resolution and focal spot size, showing that both geometry and polarization greatly affect the shape of the spot.