
Accurate measurement of the residual birefringence in VECSEL: Towards understanding of the polarization behavior under spin-polarized pumping
Author(s) -
Julien Frougier,
Ghaya Baili,
I. Sagnes,
Daniel Dolfi,
JeanMarie George,
Mehdi Alouini
Publication year - 2015
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.009573
Subject(s) - birefringence , optics , laser , lasing threshold , polarization (electrochemistry) , materials science , residual , optoelectronics , physics , chemistry , algorithm , computer science
In this paper we report birefringence measurements of an optically pumped (100)-oriented InGaAs/GaAsP multiple quantum well (MQWs) Vertical External Cavity Surface Emitting Laser (VECSEL) in oscillating conditions. The proposed technique relies on the measurement in the microwave domain of the beatnote between the oscillating mode and the amplified spontaneous emission of the cross-polarized non-lasing field lying in the following longitudinal mode. This technique is shown to offer extremely high sensitivity and accuracy enabling to track the amount of residual birefringence according to the laser operation conditions. The experience fits within the broader framework of polarization selection in spin-injected lasers.