Open AccessFemtosecond high-resolution hard X-ray spectroscopy using reflection zone plates
Author(s) -
Heike Löchel,
Christoph Braig,
Maria Brzhezinskaya,
Frank Siewert,
Peter Baumgärtel,
Alexander A. Firsov,
A. Erko
Publication year - 2015
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.008788
Subject(s) - optics , spectroscopy , synchrotron , femtosecond , reflection (computer programming) , x ray optics , materials science , resolution (logic) , x ray spectroscopy , range (aeronautics) , total internal reflection , spectral resolution , laser , spectrometer , physics , x ray , spectral line , quantum mechanics , artificial intelligence , astronomy , computer science , composite material , programming language
An off-axis total external reflection zone plate is applied to wavelength-dispersive X-ray spectrometry in the range from 7.8 keV to 9.0 keV. The resolving power E/ΔE of up to 1.1 × 10(2), demonstrated in a synchrotron proof-of-concept experiment, competes well with existing energy-dispersive instruments in this spectral range. In conjunction with the detection efficiency of (2.2 ± 0.6)%, providing a fairly constant count rate across the 1.2 keV band, the temporal pulse elongation to no more than 1.5 × 10(-15) s opens the door to wide-range, ultra-fast hard X-ray spectroscopy at free-electron lasers (FELs).