Femtosecond high-resolution hard X-ray spectroscopy using reflection zone plates | Zendy

Heike Löchel | Zendy; Christoph Braig | Zendy; Maria Brzhezinskaya | Zendy; Frank Siewert | Zendy; P. Baumgärtel | Zendy; Alexander Firsov | Zendy; A. Erko | Zendy

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Femtosecond high-resolution hard X-ray spectroscopy using reflection zone plates

Author(s) -

Heike Löchel,

Christoph Braig,

Maria Brzhezinskaya,

Frank Siewert,

P. Baumgärtel,

Alexander Firsov,

A. Erko

Publication year - 2015

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.23.008788

Subject(s) - optics , synchrotron , spectroscopy , femtosecond , x ray optics , reflection (computer programming) , resolution (logic) , x ray spectroscopy , materials science , spectral resolution , range (aeronautics) , total internal reflection , laser , spectrometer , physics , x ray , spectral line , quantum mechanics , artificial intelligence , astronomy , computer science , composite material , programming language

An off-axis total external reflection zone plate is applied to wavelength-dispersive X-ray spectrometry in the range from 7.8 keV to 9.0 keV. The resolving power E/ΔE of up to 1.1 × 10(2), demonstrated in a synchrotron proof-of-concept experiment, competes well with existing energy-dispersive instruments in this spectral range. In conjunction with the detection efficiency of (2.2 ± 0.6)%, providing a fairly constant count rate across the 1.2 keV band, the temporal pulse elongation to no more than 1.5 × 10(-15) s opens the door to wide-range, ultra-fast hard X-ray spectroscopy at free-electron lasers (FELs).

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