Frequency- and spectrally-encoded confocal microscopy
Author(s) -
Jaehyun Hwang,
Soocheol Kim,
Jung Ho Heo,
Donghak Lee,
Suho Ryu,
Chulmin Joo
Publication year - 2015
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.005809
Subject(s) - optics , materials science , microscopy , spatial frequency , optical coherence tomography , photodetector , spectral imaging , confocal , confocal microscopy , scanner , laser , light sheet fluorescence microscopy , focus (optics) , laser scanning , modulation (music) , biological specimen , fourier transform , microscope , physics , scanning confocal electron microscopy , quantum mechanics , acoustics
We describe a three-dimensional microscopy technique based on spectral and frequency encoding. The method employs a wavelength-swept laser to illuminate a specimen with a spectrally-dispersed line focus that sweeps over the specimen in time. The spatial information along each spectral line is further mapped into different modulation frequencies. Spectrally-resolved detection and subsequent Fourier analysis of the back-scattered light from the specimen therefore enable high-speed, scanner-free imaging of the specimen with a single-element photodetector. High-contrast, three-dimensional imaging capability of this method is demonstrated by presenting images of various materials and biological specimens.
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