A diffuser-based three-dimensional measurement of polarization-dependent scattering characteristics of optical films for 3D-display applications | Zendy

DaeYeon Kim | Zendy; JongWook Seo | Zendy

Open Access

A diffuser-based three-dimensional measurement of polarization-dependent scattering characteristics of optical films for 3D-display applications

Author(s) -

DaeYeon Kim,

JongWook Seo

Publication year - 2015

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.23.001063

Subject(s) - optics , polarizer , diffuser (optics) , scattering , polarization (electrochemistry) , light scattering , materials science , luminance , illuminance , birefringence , optoelectronics , physics , light source , chemistry

We propose an accurate and easy-to-use three-dimensional measurement method using a diffuser plate to analyze the scattering characteristics of optical films. The far-field radiation pattern of light scattered by the optical film is obtained from the illuminance pattern created on the diffuser plate by the light. A mathematical model and calibration methods were described, and the results were compared with those obtained by a direct measurement using a luminance meter. The new method gave very precise three-dimensional polarization-dependent scattering characteristics of scattering polarizer films, and it can play an effective role in developing high performance polarization-selective screens for 3D display applications.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research