
A diffuser-based three-dimensional measurement of polarization-dependent scattering characteristics of optical films for 3D-display applications
Author(s) -
DaeYeon Kim,
Jai Woong Seo
Publication year - 2015
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.23.001063
Subject(s) - optics , polarizer , diffuser (optics) , scattering , polarization (electrochemistry) , light scattering , materials science , luminance , illuminance , birefringence , optoelectronics , physics , light source , chemistry
We propose an accurate and easy-to-use three-dimensional measurement method using a diffuser plate to analyze the scattering characteristics of optical films. The far-field radiation pattern of light scattered by the optical film is obtained from the illuminance pattern created on the diffuser plate by the light. A mathematical model and calibration methods were described, and the results were compared with those obtained by a direct measurement using a luminance meter. The new method gave very precise three-dimensional polarization-dependent scattering characteristics of scattering polarizer films, and it can play an effective role in developing high performance polarization-selective screens for 3D display applications.