Open AccessStructural study and Raman scattering analysis of Cu_2ZnSiTe_4 bulk crystals
Author(s) -
S. Levcenko,
A. Nateprov,
Victor Ch. Kravtsov,
Maxim Guc,
Alejandro PérezRodríguez,
Victor IzquierdoRoca,
Xavier Fontané,
E. Arushanov
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.0a1936
Subject(s) - raman spectroscopy , raman scattering , tetragonal crystal system , materials science , crystal (programming language) , phonon , x ray raman scattering , optics , single crystal , crystallography , scattering , analytical chemistry (journal) , crystal structure , condensed matter physics , chemistry , physics , programming language , chromatography , computer science
Bulk crystals of Cu(2)ZnSiTe(4) (CZSiTe) have been prepared by modified Bridgman method and have been investigated by single crystal X-ray method, Energy Dispersive X-Ray analysis and Raman scattering techniques. The structural studies revealed that the CZSiTe compounds crystallizes in the tetragonal space group I4¯2m, with a = b = 5.9612(1) Å and c = 11.7887(4) Å at 293 K. The Raman spectrum characteristic of the crystals exhibits nine peaks, with two dominant peaks at approximately 134 cm(-1) and 151 cm(-1) that can be used as fingerprint peaks for the identification of this compound. The Raman peaks were analyzed on the basis of the derived irreducible representation for the zone center phonons and by comparison with experimental and theoretical data from close related semiconductors as Cu(2)FeSnS(4) and Cu(2)ZnSnSe(4).