
Three-dimensional super-resolution structured illumination microscopy with maximum a posteriori probability image estimation
Author(s) -
Tomás Lozano-Pérez,
Pavel Křížek,
Zdeněk Švindrych,
Jakub Benda,
Martin Ovesný,
Karel Fliegel,
Miloš Klíma,
Guy M. Hagen
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.029805
Subject(s) - maximum a posteriori estimation , optics , microscopy , resolution (logic) , image resolution , focus (optics) , image quality , iterative reconstruction , a priori and a posteriori , noise (video) , artificial intelligence , superresolution , computer vision , materials science , optical sectioning , image processing , computer science , image (mathematics) , maximum likelihood , physics , mathematics , statistics , philosophy , epistemology
We introduce and demonstrate a new high performance image reconstruction method for super-resolution structured illumination microscopy based on maximum a posteriori probability estimation (MAP-SIM). Imaging performance is demonstrated on a variety of fluorescent samples of different thickness, labeling density and noise levels. The method provides good suppression of out of focus light, improves spatial resolution, and allows reconstruction of both 2D and 3D images of cells even in the case of weak signals. The method can be used to process both optical sectioning and super-resolution structured illumination microscopy data to create high quality super-resolution images.