Three-dimensional super-resolution structured illumination microscopy with maximum a posteriori probability image estimation | Zendy

Tomáš Lukeš | Zendy; Pavel Křížek | Zendy; Zdeněk Švindrych | Zendy; Jakub Benda | Zendy; Martin Ovesný | Zendy; Karel Fliegel | Zendy; Miloš Klíma | Zendy; Guy M. Hagen | Zendy

Open Access

Three-dimensional super-resolution structured illumination microscopy with maximum a posteriori probability image estimation

Author(s) -

Tomáš Lukeš,

Pavel Křížek,

Zdeněk Švindrych,

Jakub Benda,

Martin Ovesný,

Karel Fliegel,

Miloš Klíma,

Guy M. Hagen

Publication year - 2014

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.22.029805

Subject(s) - maximum a posteriori estimation , optics , microscopy , image resolution , resolution (logic) , focus (optics) , image quality , iterative reconstruction , noise (video) , artificial intelligence , a priori and a posteriori , materials science , computer vision , superresolution , image processing , optical sectioning , computer science , image (mathematics) , maximum likelihood , physics , mathematics , statistics , philosophy , epistemology

We introduce and demonstrate a new high performance image reconstruction method for super-resolution structured illumination microscopy based on maximum a posteriori probability estimation (MAP-SIM). Imaging performance is demonstrated on a variety of fluorescent samples of different thickness, labeling density and noise levels. The method provides good suppression of out of focus light, improves spatial resolution, and allows reconstruction of both 2D and 3D images of cells even in the case of weak signals. The method can be used to process both optical sectioning and super-resolution structured illumination microscopy data to create high quality super-resolution images.

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