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Control of emission spectra in quantum dot microdisk/microring lasers
Author(s) -
N. V. Kryzhanovskaya,
I. S. Mukhin,
E. I. Moiseev,
I. I. Shostak,
Andrey Bogdanov,
A. M. Nadtochiy,
M. V. Maximov,
A. E. Zhukov,
M. M. Kulagina,
K. A. Vashanova,
Yu. M. Zadiranov,
S. I. Troshkov,
A. A. Lipovskii,
A. M. Mintairov
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.025782
Subject(s) - laser linewidth , lasing threshold , materials science , laser , optics , optoelectronics , quantum dot laser , quantum dot , spectral line , resonator , ion , focused ion beam , semiconductor laser theory , physics , quantum mechanics , astronomy
Focused ion beam is applied to quantum dot based microresonators to form pits or groove on their surface. The emission spectra of the resonators based lasers are significantly thinned out after the ion beam milling, and one or two modes become dominant instead of a group of modes having comparable intensities. The linewidth of the lasing mode is kept unchanged, whereas the lasing threshold demonstrates an insignificant growth.

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