Open AccessDispersion characterization of two orthogonal modes in a birefringence tellurite microstructured optical fiber
Author(s) -
Dinghuan Deng,
Daisuke Sega,
Tonglei Cheng,
Weiqing Gao,
Xiaojie Xue,
Takenobu Suzuki,
Yasutake Ohishi
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.023920
Subject(s) - optics , materials science , birefringence , photonic crystal fiber , graded index fiber , dispersion shifted fiber , dispersion (optics) , interferometry , polarization maintaining optical fiber , optical fiber , zero dispersion wavelength , optical path length , white light interferometry , fiber , single mode optical fiber , fiber optic sensor , physics , composite material
An elliptical core tellurite microstructured optical fiber with high birefringence was demonstrated and the chromatic dispersion of the two orthogonal modes in this fiber was experimentally characterized by a white light spectral interferometric technique over a wide spectral range. A series of spectral interferograms as a function of the optical path difference were recorded in the Mach-Zehnder interferometer. The birefringence dependence of the wavelength in the fiber was determined by interferograms. The measured and calculated dispersion matched well within the whole spectrum range under test.