Open AccessMode size converter between high-index-contrast waveguide and cleaved single mode fiber using SiON as intermediate material
Author(s) -
Litao Jia,
Jun-Feng Song,
Tsung-Yang Liow,
Xianshu Luo,
Xiaoguang Tu,
FengLing Qing,
Sing-Chee Koh,
Mingbin Yu,
GuoQiang Lo
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.023652
Subject(s) - waveguide , materials science , coupling loss , optics , radiation mode , single mode optical fiber , refractive index , insertion loss , optical fiber , multi mode optical fiber , leaky mode , equilibrium mode distribution , refractive index contrast , refractive index profile , optoelectronics , physics , fabrication , medicine , alternative medicine , pathology
High-index-contrast (HIC) waveguide such as Si and Si3N4 has small mode size enabling compact integration. However, the coupling loss with single mode fiber is also remarkable owning to the mode mismatching. Therefore, mode size converter, as the interface between HIC waveguide and optical fiber, takes an important role in the field of integrated optics. The material with refractive index (RI) between HIC waveguide and optical fiber can be used as a bridge to reduce the mode mismatching loss. In this letter, we employ silicon oxynitride (SiON) with RI about 1.50 as the intermediate material and optimize the structure of the SiON waveguide to match with cleaved single mode fiber and HIC waveguide separately. Combined with inverse taper and suspended structure, the mismatching loss is reduced and the dependence to the dimension of the structure is also released. The coupling loss is 1.2 and 1.4 dB/facet for TE and TM mode, respectively, with 3 dB alignment tolerance of ± 3.5 μm for Si(3)N(4) waveguide with just 200 nm-wide tip. While for Si waveguide, a critical dimension of 150 nm is applied due to the higher index contrast than Si(3)N(4) waveguide. Similar alignment tolerance is realized with coupling loss about 1.8 and 2.1 dB/facet for TE and TM mode. The polarization dependence loss (PDL) for both platforms is within 0.5 dB.