
Independently analyzing different surface plasmon polariton modes on silver nanowire
Author(s) -
Aiping Liu,
ChangLing Zou,
Xi-Feng Ren,
X. Xiong,
Yong-Jing Cai,
Haitao Liu,
Fang-Wen Sun,
Guo-Ping Guo
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.023372
Subject(s) - near field scanning optical microscope , surface plasmon polariton , optics , surface plasmon , excitation , plasmon , polariton , nanowire , materials science , field (mathematics) , characterization (materials science) , near and far field , optical microscope , optoelectronics , physics , scanning electron microscope , mathematics , quantum mechanics , pure mathematics
In this paper, surface plasmon polariton (SPP) modes on silver nanowire (AgNW), with different field symmetric, are studied by different near field methods, respectively. In the experiment, the excitation and detection of SPPs are performed by two probes of near field scanning optical microscope (NSOM) simultaneously, which realizes the study of SPPs in complete near field. By controlling the experimental conditions, two of the fundamental SPP modes are detected separately and their intensity distributions on AgNW are given by the NSOM images. In the discussion, creeping wave (CW) is introduced to analyze the experimental results, which improves the coincidence of the experimental results and the theoretical calculations. A detailed characterization of SPPs modes in near field, which gives a further insight into optical properties of AgNW, will benefit integrated optical circuits.