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Improved axial resolution of FINCH fluorescence microscopy when combined with spinning disk confocal microscopy
Author(s) -
Nisan Siegel,
Gary Brooker
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.022298
Subject(s) - optics , confocal , confocal microscopy , microscopy , materials science , digital holographic microscopy , fluorescence microscope , light sheet fluorescence microscopy , focus (optics) , resolution (logic) , scanning confocal electron microscopy , scanner , super resolution microscopy , microscope , holography , fluorescence lifetime imaging microscopy , fluorescence , physics , computer science , artificial intelligence
FINCH holographic fluorescence microscopy creates super-resolved images with enhanced depth of focus. Addition of a Nipkow disk real-time confocal image scanner is shown to reduce the FINCH depth of focus while improving transverse confocal resolution in a combined method called "CINCH".

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