Open AccessThin layer terahertz sensing using two-channel parallel-plate waveguides
Author(s) -
Hyeon Sang Bark,
Jingshu Zha,
Eui Su Lee,
Tae-In Jeon
Publication year - 2014
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.016738
Subject(s) - optics , terahertz radiation , finite difference time domain method , materials science , refractive index , dielectric , layer (electronics) , thin film , channel (broadcasting) , optoelectronics , physics , telecommunications , composite material , nanotechnology , computer science
We report on the highly sensitive terahertz measurement of a thin, dielectric layer using two channels formed by inserting a single slit sheet in the parallel-plate waveguides (PPWGs). When a thin layer is applied to coat the upper surface of the channel, the single resonance frequency caused by the two-channel PPWGs is shifted as a result of the layer's properties, including length, thickness, and refractive index. The measured frequency tuning sensitivities (FTS) throughout the 20-mm layer length are 2.41 and -1.95 GHz/mm at the open upper and lower channels, respectively. The experimental results agree with those of theoretical simulations performed using the finite-difference time-domain (FDTD) method.