Open AccessDesign and optimization of a parallel spectrometer for ultra-fast X-ray science
Author(s) -
Christoph Braig,
Heike Löchel,
R. Mitzner,
Wilson Quevedo,
Panagiotis Loukas,
Markus Kubin,
Christian Weniger,
Alexander A. Firsov,
Jens Rehanek,
Maria Brzhezinskaya,
Philippe Wernet,
Alexander Föhlisch,
A. Erko
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.012583
Subject(s) - optics , spectrometer , diffraction efficiency , diffraction , femtosecond , x ray optics , diffraction grating , materials science , line (geometry) , beamline , focal length , curvature , physics , beam (structure) , lens (geology) , laser , x ray , geometry , mathematics
In the present work, different varied line space (VLS) and reflection zone plate (RZP) gratings are analyzed for their suitability in low-signal femtosecond soft X-ray spectroscopy. The need for high efficiency suggests a straightened focal line whose sharpness and residual curvature will determine the quality. One- and two-dimensional VLS structures feature an attractive trade-off between a sufficient optical performance and a strongly relaxed fabrication, due to moderate line densities which are easily accessible by e-beam lithography. Based on fanned-out RZP arrays, their continuous limit version is identified to generate an almost perfect focal line however, with an aberration level three orders of magnitude better than for the VLS gratings and well below the diffraction limit over large acceptance angles.