X-ray diffraction tomography employing an annular beam

We demonstrate depth-resolved materials characterization by scanning a sample through an annular beam of X-rays. We measure Bragg X-ray diffraction from a sample with a planar detector positioned centrally in a circular dark field defined by the annular beam. The diffraction maxima are optically encoded with the position of crystalline phases along this beam. Depth-resolved material phase images are recovered via tomosynthesis. We demonstrate our technique using a heterogeneous three-dimensional object comprising three different phases; cyclotetramethylene - tetranitramine, copper and nickel, distributed in a low density medium. Our technique has wide applicability in analytical imaging and is scalable with respect to both scan size and X-ray energy.