Open AccessX-ray diffraction tomography employing an annular beam
Author(s) -
Paul Evans,
Keith Rogers,
Anthony Dicken,
Simon X. Godber,
Danae Prokopiou
Publication year - 2014
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.011930
Subject(s) - optics , materials science , tomosynthesis , diffraction , beam (structure) , tomography , detector , planar , bragg's law , physics , mammography , medicine , computer graphics (images) , cancer , breast cancer , computer science
We demonstrate depth-resolved materials characterization by scanning a sample through an annular beam of X-rays. We measure Bragg X-ray diffraction from a sample with a planar detector positioned centrally in a circular dark field defined by the annular beam. The diffraction maxima are optically encoded with the position of crystalline phases along this beam. Depth-resolved material phase images are recovered via tomosynthesis. We demonstrate our technique using a heterogeneous three-dimensional object comprising three different phases; cyclotetramethylene - tetranitramine, copper and nickel, distributed in a low density medium. Our technique has wide applicability in analytical imaging and is scalable with respect to both scan size and X-ray energy.