
Short pulse carrier-envelope phase absolute single-shot measurement by photoionization of gases with a guided laser beam
Author(s) -
V. V. Strelkov,
E. Mével,
Éric Constant
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.006239
Subject(s) - optics , carrier envelope phase , laser , photoionization , ultrashort pulse , physics , materials science , ionization , ion , quantum mechanics
We present an all optical approach to measure the value of the carrier-envelope phase (CEP) of a short intense laser pulse. This method relies on photo-ionization of gases with a guided laser beam. This approach that provides the absolute value of the CEP, is compatible with single shot characterization, is scalable in wavelength, does not suffer from bandwidth limitation and is largely intensity independent. It has also the potential to provide a full characterization of the pulse profile via high order autocorrelation on a single shot basis.