Open AccessImpact of interface roughness on the performance of broadband blackbody absorber based on dielectric-metal film multilayers
Author(s) -
Shy-Hauh Guo,
A. B. Sushkov,
Dong Hun Park,
H. D. Drew,
P. W. Kolb,
Warren N. Herman,
R. J. Phaneuf
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.001952
Subject(s) - materials science , dielectric , surface finish , optics , absorption (acoustics) , optoelectronics , surface roughness , black body radiation , reflection (computer programming) , layer (electronics) , evaporation , transmittance , composite material , radiation , computer science , physics , thermodynamics , programming language
We report on factors affecting the performance of a broadband, mid-IR absorber based on multiple, alternating dielectric / metal layers. In particular, we investigate the effect of interface roughness. Atomic layer deposition produces both a dramatic suppression of the interface roughness and a significant increase in the optical absorption as compared to devices fabricated using a conventional thermal evaporation source. Absorption characteristics greater than 80% across a 300 K black body spectrum are achieved. We demonstrate a further increase in this absorption via the inclusion of a patterned, porous anti-reflection layer.