Open AccessFast volumetric phase-gradient imaging in thick samples
Author(s) -
J. David Giese,
Tim N. Ford,
Jérôme Mertz
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.001152
Subject(s) - optics , deconvolution , materials science , optical sectioning , depth of field , lens (geology) , microscopy , phase (matter) , image processing , resolution (logic) , physics , image (mathematics) , computer science , artificial intelligence , quantum mechanics
Oblique back-illumination microscopy (OBM) provides high resolution, sub-surface phase-gradient images from arbitrarily thick samples. We present an image formation theory for OBM and demonstrate that OBM lends itself to volumetric imaging because of its capacity for optical sectioning. In particular, OBM can provide extended depth of field (EDOF) images from single exposures, by rapidly scanning the focal plane with an electrically tunable lens. These EDOF images can be further enhanced by deconvolution. We corroborate our theory with experimental volumetric images obtained from transparent bead samples and mouse cortical brain slices.