Open AccessPrecision measurement of the photon detection efficiency of silicon photomultipliers using two integrating spheres
Author(s) -
Seul Ki Yang,
J. Lee,
Sug Whan Kim,
Hye Young Lee,
J. A. Jeon,
I. H. Park,
Jae Ryong Yoon,
Yang Sik Baek
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.000716
Subject(s) - silicon photomultiplier , optics , detector , photon counting , photomultiplier , nist , irradiance , avalanche photodiode , photodiode , physics , photodetector , photon , instrumentation (computer programming) , wavelength , measurement uncertainty , metrology , optoelectronics , scintillator , computer science , quantum mechanics , natural language processing , operating system
We report a new and improved photon counting method for the precision PDE measurement of SiPM detectors, utilizing two integrating spheres connected serially and calibrated reference detectors. First, using a ray tracing simulation and irradiance measurement results with a reference photodiode, we investigated irradiance characteristics of the measurement instrument, and analyzed dominating systematic uncertainties in PDE measurement. Two SiPM detectors were then used for PDE measurements between wavelengths of 368 and 850 nm and for bias voltages varying from around 70V. The resulting PDEs of the SiPMs show good agreement with those from other studies, yet with an improved accuracy of 1.57% (1σ). This was achieved by the simultaneous measurement with the NIST calibrated reference detectors, which suppressed the time dependent variation of source light. The technical details of the instrumentation, measurement results and uncertainty analysis are reported together with their implications.