Open AccessNon-binary phase gratings for x-ray imaging with a compact Talbot interferometer
Author(s) -
Andre Yaroshenko,
Martin Bech,
Guillaume Potdevin,
Andreas Malecki,
Thomas Biernath,
Johannes Wolf,
Arne Tapfer,
Markus Schüttler,
Jan Meiser,
N. Kunka,
Maximilian Amberger,
J. Mohr,
Franz Pfeiffer
Publication year - 2014
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.22.000547
Subject(s) - optics , talbot effect , monochromatic color , interferometry , phase contrast imaging , binary number , diffraction grating , grating , phase (matter) , physics , x ray optics , astronomical interferometer , materials science , x ray , arithmetic , mathematics , quantum mechanics , phase contrast microscopy
X-ray imaging using a Talbot-Lau interferometer, consisting of three binary gratings, is a well-established approach to acquire x-ray phase-contrast and dark-field images with a polychromatic source. However, challenges in the production of high aspect ratio gratings limit the construction of a compact setup for high x-ray energies. In this study we consider the use of phase gratings with triangular-shaped structures in an x-ray interferometer and show that such gratings can yield high visibilities for significantly shorter propagation distances than conventional gratings with binary structures. The findings are supported by simulation and experimental results for both cases of a monochromatic and a polychromatic source.