Open AccessUsing coherent X-ray ptychography to probe medium-range order
Author(s) -
Angela Torrance,
Brian Abbey,
Corey T. Putkunz,
Daniele Pelliccia,
Eugeniu Balaur,
Garth J. Williams,
D. J. Vine,
Andrei Yurievich Nikulin,
Ian McNulty,
Harry M. Quiney,
Keith A. Nugent
Publication year - 2013
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.028019
Subject(s) - ptychography , optics , diffraction , amorphous solid , spheres , materials science , microscopy , coherent diffraction imaging , characterization (materials science) , range (aeronautics) , physics , phase retrieval , crystallography , fourier transform , chemistry , astronomy , quantum mechanics , composite material
Characterization of microscopic structural order and in particular medium range order (MRO) in amorphous materials is challenging. A new technique is demonstrated that allows analysis of MRO using X-rays. Diffraction data were collected from a sample consisting of densely packed polystyrene-latex micro-spheres. Ptychography is used to reconstruct the sample transmission function and fluctuation microscopy applied to characterize structural order producing a detailed `fluctuation map' allowing analysis of the sample at two distinct length scales. Independent verification is provided via X-ray diffractometry. Simulations of dense random packing of spheres have also been used to explore the origin of the structural order measured.