Open AccessTransverse mode discrimination in long-wavelength wafer-fused vertical-cavity surface-emitting lasers by intra-cavity patterning
Author(s) -
Nicolas Volet,
Tomasz Czyszanowski,
Jarosław Walczak,
Lukas Mutter,
B. Dwir,
Zlatko Micković,
Pascal Gallo,
A. Caliman,
Alexei Sirbu,
A. Mereuta,
В. Яковлев,
E. Kapon
Publication year - 2013
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.026983
Subject(s) - optics , materials science , wafer , transverse mode , laser , transverse plane , distributed bragg reflector , optoelectronics , aperture (computer memory) , wavelength , numerical aperture , semiconductor laser theory , vertical cavity surface emitting laser , longitudinal mode , physics , structural engineering , acoustics , engineering
Transverse mode discrimination is demonstrated in long-wavelength wafer-fused vertical-cavity surface-emitting lasers using ring-shaped air gap patterns at the fused interface between the cavity and the top distributed Bragg reflector. A significant number of devices with varying pattern dimensions was investigated by on-wafer mapping, allowing in particular the identification of a design that reproducibly increases the maximal single-mode emitted power by about 30 %. Numerical simulations support these observations and allow specifying optimized ring dimensions for which higher-order transverse modes are localized out of the optical aperture. These simulations predict further enhancement of the single-mode properties of the devices with negligible penalty on threshold current and emitted power.