Open AccessNon-iterative determination of pattern phase in structured illumination microscopy using auto-correlations in Fourier space
Author(s) -
Kai Wicker
Publication year - 2013
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.024692
Subject(s) - fourier transform , optics , phase correlation , phase retrieval , iterative reconstruction , noise (video) , a priori and a posteriori , computer science , deconvolution , fourier analysis , iterative method , artificial intelligence , phase (matter) , microscopy , image processing , algorithm , computer vision , physics , image (mathematics) , short time fourier transform , philosophy , epistemology , quantum mechanics
The artefact-free reconstruction of structured illumination microscopy images requires precise knowledge of the pattern phases in the raw images. If this parameter cannot be controlled precisely enough in an experimental setup, the phases have to be determined a posteriori from the acquired data. While an iterative optimisation based on cross-correlations between individual Fourier images yields accurate results, it is rather time-consuming. Here I present a fast non-iterative technique which determines each pattern phase from an auto-correlation of the respective Fourier image. In addition to improving the speed of the reconstruction, simulations show that this method is also more robust, yielding errors of typically less than λ/500 under realistic signal-to-noise levels.