
Trapping mid-infrared rays in a lossy film with the Berreman mode, epsilon near zero mode, and magnetic polaritons
Author(s) -
Yubin Chen,
Feng-Cheng Chiu
Publication year - 2013
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.020771
Subject(s) - optics , polariton , materials science , permittivity , absorptance , dielectric , infrared , wavelength , optoelectronics , physics , reflectivity
Triple mechanisms were employed to trap mid-infrared (mid-IR) rays within a semi-transparent SiO(2) film sandwiched between gold gratings and a gold substrate. Dimensions of four absorbers were explicitly determined using an LC (inductor-capacitor) circuit model considering the role transition of SiO(2) film. The film behaves as a capacitance and an inductance when the real part of relative electric permittivity for SiO(2) is positive and negative, respectively. At the normal incidence of transverse magnetic waves, every absorptance spectrum of absorbers showed a peak at wavelength λ = 10 μm due to the first mode excitation of magnetic polaritons (MP). At oblique incidence, the Berreman mode led to another peak at λ = 8 μm while its bandwidth was expanded with epsilon near zero mode excited by diffracted waves. The full-width-at-half-maximum of both peaks exceeded 0.6 μm thanks to the SiO(2) loss. Other minor absorptance peaks in the mid-IR were caused by variants of the same MP mode.