Open AccessDynamic light scattering microscope: Accessing opaque samples with high spatial resolution
Author(s) -
Takashi Hiroi,
Mitsuhiro Shibayama
Publication year - 2013
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.020260
Subject(s) - opacity , optics , light scattering , electric field , scattering , microscope , dynamic light scattering , materials science , image resolution , microscopy , optical microscope , dynamic range , physics , scanning electron microscope , nanotechnology , quantum mechanics , nanoparticle
We developed a new technique that conducts dynamic light scattering (DLS) under a microscope with high spatial resolution. This technique dramatically extends the range of DLS application from transparent to opaque samples. The total scattered electric field contains both electric field generated from the samples and time-independent reflected electric field. These two components are decomposed by applying a partial heterodyne method. By using this technique, we successfully calculate the characteristic size distribution of both multiple-scattering samples and strong light-absorbing samples. This is the first study to observe the collective motion of particles in a highly concentrated solution by using DLS.