Open AccessConductive optical-fiber STM probe for local excitation and collection of cathodoluminescence at semiconductor surfaces
Author(s) -
Kentaro Watanabe,
Yoshiaki Nakamura,
Masakazu Ichikawa
Publication year - 2013
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.019261
Subject(s) - cathodoluminescence , luminescence , materials science , optoelectronics , semiconductor , excitation , optics , optical fiber , common emitter , physics , quantum mechanics
Luminescence imaging of semiconductor surfaces in nanometric resolution is a key to novel optoelectronic nano-devices, which requires local carrier excitation and local luminescence collection within the nanometric areas at the surfaces. However, there have not been a practical nanospectroscopies applicable to wide range of specimens. STM-cathodoluminescence (STM-CL) nanospectroscopy offers both high spatial resolution (of the order of 10 nm) and novel high carrier excitation power (up to ~1 mW), which enables local luminescence imaging of less-luminescent nano-structures. In this study, we advanced STM-CL technique by introducing a novel optical fiber probe with Cr thin film coating (Cr-FP), which was found to work as a STM probe, as an electron field-emitter for local carrier excitation, and as an alignment-free efficient local STM-CL collector which blinds luminescence after the minority carrier diffusion.