Open AccessApplicability analysis of wavelet-transform profilometry
Author(s) -
Zibang Zhang,
Jingang Zhong
Publication year - 2013
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.018777
Subject(s) - demodulation , profilometer , wavelet transform , linearity , optics , wavelet , phase (matter) , spatial frequency , computer science , materials science , artificial intelligence , physics , surface finish , electronic engineering , telecommunications , engineering , channel (broadcasting) , quantum mechanics , composite material
The applicability of the wavelet-transform profilometry is examined in detail. The wavelet-ridge-based phase demodulation is an integral operation of the fringe signal in the spatial domain. The accuracy of the phase demodulation is related to the local linearity of the phase modulated by the object surface. We present a more robust applicability condition which is based on the evaluation of the local linearity. Since high carrier frequency leads to the phase demodulation integral in a narrow interval and the narrow interval results in the high local linearity of modulated phase, we propose to increase the carrier fringe frequency to improve the applicability of the wavelet-transform profilometry and the measurement accuracy. The numerical simulations and the experiment are presented.