Open AccessSuper-resolution complex amplitude reconstruction of nanostructured binary data using an interference microscope with pattern matching
Author(s) -
Satoshi Ishikawa,
Yoshio Hayasaki
Publication year - 2013
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.018424
Subject(s) - optics , finite difference time domain method , microscope , interference (communication) , fourier transform , interference microscopy , diffraction , binary number , spatial frequency , amplitude , binary data , nanostructure , noise (video) , materials science , microscopy , physics , computer science , mathematics , nanotechnology , image (mathematics) , artificial intelligence , telecommunications , channel (broadcasting) , arithmetic , quantum mechanics
We propose a new method of optically reconstructing binary data formed by nanostructures with an elemental size several tens of nanometers smaller than the diffraction limit, implemented with an interference microscope and a complex-amplitude image pattern matching method. We examine the size dependency of the data reconstruction capacity using a light propagation simulation based on the finite-difference time-domain (FDTD) method and the Fourier spatial frequency filtering method. We demonstrated that the readable size of the binary nanostructure depends on the magnitude of noise.