Open AccessNovel 3D SEM Moiré method for micro height measurement
Author(s) -
Chuanwei Li,
Zhanwei Liu,
Huimin Xie,
Dan Wu
Publication year - 2013
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.015734
Subject(s) - optics , moiré pattern , sensitivity (control systems) , structured light 3d scanner , projection (relational algebra) , materials science , computer science , physics , algorithm , scanner , electronic engineering , engineering
A 3D SEM Moiré Method (SMM) is proposed in this investigation for the first time for 3D shape measurement with nano-scale sensitivity. The geometric model of the 3D SMM has been theoretically established, combining the stereovision technology in an SEM with the existing principles of in-plane SMM. The Virtual Projection Fringe (VPF) generated under different conditions has been analyzed for 3D reconstructions. Two typical applications have been used to experimentally validate the theoretical model. Experimental results, with the height measurement sensitivity less than 10nm, agree well with the theoretical model we proposed. The uncertainty analysis for the method has also been performed by other auxiliary measurements.