
Sensitivity optimization of the one beam Z-scan technique and a Z-scan technique immune to nonlinear absorption
Author(s) -
José Antonio Dávila Pintle,
E. Reynoso Lara,
M. D. Iturbe Castillo
Publication year - 2013
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.015350
Subject(s) - optics , z scan technique , transmittance , refractive index , aperture (computer memory) , materials science , beam (structure) , attenuation coefficient , sensitivity (control systems) , radius , signal beam , physics , nonlinear optics , laser , computer security , electronic engineering , computer science , acoustics , engineering
It is presented a criteria for selecting the optimum aperture radius for the one beam Z-scan technique (OBZT), based on the analysis of the transmittance of the aperture. It is also presented a modification to the OBZT by directly measuring the beam radius in the far field with a rotating disk, which allows to determine simultaneously the non-linear absorptive coefficient and non-linear refractive index, much less sensitive to wave front distortions caused by inhomogeneities of the sample with a negligible loss of signal to noise ratio. It is demonstrated its equivalence to the OBZT.