Open AccessInner structure detection by optical tomography technology based on feedback of microchip Nd:YAG lasers
Author(s) -
Chunxin Xu,
Shulian Zhang,
Yidong Tan,
Shijie Zhao
Publication year - 2013
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.011819
Subject(s) - optics , laser , materials science , optical tomography , tomography , resolution (logic) , optical coherence tomography , optoelectronics , computer science , physics , artificial intelligence
We describe a new optical tomography technology based on feedback of microchip Nd:YAG lasers. In the case of feedback light frequency-shifted, light can be magnified by a fact of 10(6) in the Nd:YAG microchip lasers, which makes it possible to realize optical tomography with a greater depth than current optical tomography. The results of the measuring and imaging of kinds of samples are presented, which demonstrate the feasibility and potential of this approach in the inner structure detection. The system has a lateral resolution of ~1 μm, a vertical resolution of 15 μm and a longitudinal scanning range of over 10mm.