Open AccessPolarization insensitive silicon immersion grating based on total internal reflection
Author(s) -
Yuichi Higuchi,
Y. Ishii,
Koichi Hadama,
Joji Yamaguchi,
Tsuyoshi Yamamoto
Publication year - 2013
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.009664
Subject(s) - materials science , optics , grating , diffraction efficiency , refractive index , dielectric , polarization (electrochemistry) , diffraction grating , diffraction , ultrasonic grating , total internal reflection , oil immersion , optoelectronics , silicon , blazed grating , physics , chemistry
We describe an immersion grating (IG) with both low polarization-dependent loss (PDL) and high diffraction efficiency. Our immersion grating consists of a silicon (Si) prism and a Si grating coated with dielectric film. We analyze the effect of the refractive index of dielectric film and clarify the refractive index ratio between a Si grating and dielectric film. Selecting an adequate material for the dielectric film, we design the diffraction efficiency of TM polarization without changing that of TE polarization. The simulation results for the optimized IG show a PDL of 0.2 dB and diffraction efficiency of -0.4 dB. A prototype with high dispersion power provides a low PDL of 0.6 dB, while maintaining a high diffraction efficiency of -0.4 dB.