Open AccessX-ray phase imaging with a laboratory source using selective reflection from a mirror
Author(s) -
Daniele Pelliccia,
David M. Paganin
Publication year - 2013
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.009308
Subject(s) - optics , refraction , phase contrast imaging , total internal reflection , reflection (computer programming) , x ray optics , phase (matter) , beam (structure) , x ray phase contrast imaging , physics , contrast (vision) , curved mirror , materials science , x ray , phase contrast microscopy , quantum mechanics , computer science , programming language
A novel approach for hard x-ray phase contrast imaging with a laboratory source is reported. The technique is based on total external reflection from the edge of a mirror, aligned to intercept only half of the incident beam. The mirror edge thus produces two beams. The refraction x-rays undergo when interacting with a sample placed before the mirror, causes relative intensity variations between direct and reflected beams. Quantitative phase contrast and pure absorption imaging are demonstrated using this method.