Open AccessUltrafast optical wide field microscopy
Author(s) -
Minah Seo,
S. Boubanga-Tombet,
Jinkyoung Yoo,
Zahyun Ku,
Aaron Gin,
S. T. Picraux,
Steven R. J. Brueck,
Antoinette J. Taylor,
Rohit P. Prasankumar
Publication year - 2013
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.008763
Subject(s) - optics , ultrashort pulse , femtosecond , materials science , microscopy , image resolution , near field scanning optical microscope , temporal resolution , optoelectronics , silicon , detector , optical microscope , laser , physics , scanning electron microscope
We have developed a new imaging method, ultrafast optical wide field microscopy, capable of rapidly acquiring wide field images of nearly any sample in a non-contact manner with high spatial and temporal resolution. Time-resolved images of the photoinduced changes in transmission for a patterned semiconductor thin film and a single silicon nanowire after optical excitation are captured using a two-dimensional smart pixel array detector. These images represent the time-dependent carrier dynamics with high sensitivity, femtosecond time resolution and sub-micrometer spatial resolution.