Ultrafast optical wide field microscopy | Zendy

Minah Seo | Zendy; Stéphane Boubanga Tombet | Zendy; Jinkyoung Yoo | Zendy; Zahyun Ku | Zendy; Aaron Gin | Zendy; S. T. Picraux | Zendy; S. R. J. Brueck | Zendy; Antoinette J. Taylor | Zendy; Rohit P. Prasankumar | Zendy

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Ultrafast optical wide field microscopy

Author(s) -

Minah Seo,

Stéphane Boubanga Tombet,

Jinkyoung Yoo,

Zahyun Ku,

Aaron Gin,

S. T. Picraux,

S. R. J. Brueck,

Antoinette J. Taylor,

Rohit P. Prasankumar

Publication year - 2013

Publication title -

optics express

Language(s) - Uncategorized

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.21.008763

Subject(s) - optics , ultrashort pulse , femtosecond , materials science , microscopy , image resolution , near field scanning optical microscope , temporal resolution , optoelectronics , silicon , detector , optical microscope , laser , physics , scanning electron microscope

We have developed a new imaging method, ultrafast optical wide field microscopy, capable of rapidly acquiring wide field images of nearly any sample in a non-contact manner with high spatial and temporal resolution. Time-resolved images of the photoinduced changes in transmission for a patterned semiconductor thin film and a single silicon nanowire after optical excitation are captured using a two-dimensional smart pixel array detector. These images represent the time-dependent carrier dynamics with high sensitivity, femtosecond time resolution and sub-micrometer spatial resolution.

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