Open AccessAn optical test for identifying topological insulator thin films
Author(s) -
Jun–ichi Inoue
Publication year - 2013
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.008564
Subject(s) - topological insulator , polarization (electrochemistry) , optics , electromagnetic radiation , insulator (electricity) , thin film , interference (communication) , materials science , physics , optoelectronics , computer science , telecommunications , nanotechnology , condensed matter physics , channel (broadcasting) , chemistry
As the search for new compounds of a topological insulator (TI) becomes more extensive, it is increasingly important to develop an experimental technique that can identify TIs. In this work, we theoretically propose a simple optical method for distinguishing between topological and conventional insulator thin films. An electromagnetic interference wave consisting of waves transmitted through and reflected by the TI thin film is sensitive to the circular polarization direction of the incident electromagnetic wave. Based on this fact, we can identify a TI by observing the interference wave. This method is straightforward, and thus should propel TI research.