Open AccessPower monitoring in dielectric-loaded plasmonic waveguides with internal Wheatstone bridges
Author(s) -
Jacek Gosciniak,
Michael Grøndahl Nielsen,
Laurent Markey,
Alain Dereux,
Sergey I. Bozhevolnyi
Publication year - 2013
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.005300
Subject(s) - materials science , wheatstone bridge , surface plasmon polariton , optics , optoelectronics , wafer , dielectric , surface plasmon , plasmon , electrode , voltage , resistor , electrical engineering , chemistry , physics , engineering
We report on monitoring the mode power in dielectric-loaded surface plasmon polariton waveguides (DLSPPWs) by measuring the resistance of gold electrodes, supporting the DLSPPW mode propagation, with internal (on-chip) Wheatstone bridges. The investigated DLSPPW configuration consisted of 1-μm-thick and 10-μm-wide cycloaliphatic acrylate polymer ridges tapered laterally to a 1-μm-wide ridge placed on a 50-nm-thin and 4-um wide gold stripe, all supported by a ~1.7-µm-thick Cytop layer deposited on a Si wafer. The fabricated DLSPPW power monitors were characterized at telecom wavelengths, showing very high responsivities reaching up to ~6.4 μV/μW (for a bias voltage of 245 mV) and the operation bandwidth exceeding 40 kHz.