Open AccessDiminishing relative jitter in electrooptic sampling of active mm-wave and THz circuits
Author(s) -
Mehran Jamshidifar,
Peter Haring Bolívar
Publication year - 2013
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.004396
Subject(s) - terahertz radiation , jitter , optics , femtosecond , electronic circuit , broadband , laser , transmission line , sampling (signal processing) , materials science , synchronization (alternating current) , generator (circuit theory) , optoelectronics , physics , computer science , telecommunications , power (physics) , detector , quantum mechanics , channel (broadcasting)
In this work a novel approach in synchronization of electrooptic sampling systems for the ultra-broadband characterization of active mm-wave and THz devices is presented. The relative time jitter between sampled circuit and probing electrooptic head is eliminated by using a femtosecond laser system both as the generator of CW driving the device under test as well as the impulsively probing element. Previous ultra-broadband approaches were applicable to passive components driven by THz impulses, only. The presented system is more generally applicable to active mm-wave and THz components driven by conventional CW electronic sources. Broadband analysis on silicon nonlinear transmission line elements up to a frequency of 300 GHz is presented in order to illustrate the capabilities of the concept.