Open AccessNear-field imaging and nano-Fourier-transform infrared spectroscopy using broadband synchrotron radiation
Author(s) -
Péter Hermann,
Arne Hoehl,
Piotr Patoka,
Florian Huth,
E. Rühl,
G. Ulm
Publication year - 2013
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.002913
Subject(s) - optics , synchrotron radiation , fourier transform spectroscopy , infrared , fourier transform infrared spectroscopy , materials science , fourier transform , spectroscopy , broadband , radiation , thermal infrared spectroscopy , synchrotron , near field scanning optical microscope , near infrared spectroscopy , radiant intensity , optoelectronics , physics , scanning electron microscope , optical microscope , quantum mechanics
We demonstrate scanning near-field optical microscopy with a spatial resolution below 100 nm by using low intensity broadband synchrotron radiation in the IR regime. The use of such a broadband radiation source opens up the possibility to perform nano-Fourier-transform infrared spectroscopy over a wide spectral range.