Open AccessSuper-resolution differential interference contrast microscopy by structured illumination
Author(s) -
Jianling Chen,
Xu Yan,
Xiaohua Lv,
Xiaomin Lai,
Shaoqun Zeng
Publication year - 2013
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.21.000112
Subject(s) - differential interference contrast microscopy , optics , microscopy , resolution (logic) , materials science , diffraction , image resolution , numerical aperture , interference microscopy , optical microscope , condenser (optics) , interference (communication) , light sheet fluorescence microscopy , scanning confocal electron microscopy , physics , scanning electron microscope , computer science , wavelength , telecommunications , light source , channel (broadcasting) , artificial intelligence
We propose a structured illumination differential interference contrast (SI-DIC) microscopy, breaking the diffraction resolution limit of differential interference contrast (DIC) microscopy. SI-DIC extends the bandwidth of coherent transfer function of the DIC imaging system, thus the resolution is improved. With 0.8 numerical aperture condenser and objective, the reconstructed SI-DIC image of 53 nm polystyrene beads reveals lateral resolution of approximately 190 nm, doubling that of the conventional DIC image. We also demonstrate biological observations of label-free cells with improved spatial resolution. The SI-DIC microscopy can provide sub-diffraction resolution and high contrast images with marker-free specimens, and has the potential for achieving sub-diffraction resolution quantitative phase imaging.
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