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Fluorescence lifetime imaging with pulsed diode laser enabled stimulated emission
Author(s) -
Jun Ge,
Cuifang Kuang,
Shin Shian Lee,
Fu Jen Kao
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.028216
Subject(s) - laser , optics , materials science , semiconductor laser theory , diode , optoelectronics , fluorescence lifetime imaging microscopy , fluorescence , wavelength , signal (programming language) , laser diode , physics , computer science , programming language
We present here a stimulated emission based fluorescence lifetime imaging (FLIM) scheme using a pair of synchronized diode lasers operating at gain switched pulse mode. The two semiconductor lasers, with wavelengths at 635 nm and 700 nm, serve as the excitation and the stimulation light sources for the ATTO647N labeled sample, respectively. FLIM is readily achieved with their relative time delay controlled electronically. The coherent nature of the stimulated emission signal also allows FLIM at long working distance. In this way, a high performance all-semiconductor FLIM module is realized in a flexible, compact, and cost effective configuration.

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