Line scan - structured illumination microscopy super-resolution imaging in thick fluorescent samples | Zendy

Ondřej Mandula | Zendy; Martin Kielhorn | Zendy; Kai Wicker | Zendy; Gerhard Krampert | Zendy; Ingo Kleppe | Zendy; Rainer Heintzmann | Zendy

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Line scan - structured illumination microscopy super-resolution imaging in thick fluorescent samples

Author(s) -

Ondřej Mandula,

Martin Kielhorn,

Kai Wicker,

Gerhard Krampert,

Ingo Kleppe,

Rainer Heintzmann

Publication year - 2012

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.20.024167

Subject(s) - optics , microscopy , light sheet fluorescence microscopy , materials science , fluorescence , resolution (logic) , fluorescence microscope , focus (optics) , fluorescence lifetime imaging microscopy , image resolution , physics , artificial intelligence , computer science

Structured illumination microscopy in thick fluorescent samples is a challenging task. The out-of-focus fluorescence background deteriorates the illumination pattern and the reconstructed images suffer from influence of noise. We present a combination of structured illumination microscopy with line scanning. This technique reduces the out-of-focus fluorescence background, which improves the modulation and the quality of the illumination pattern and therefore facilitates the reconstruction. We present super-resolution, optically sectioned images of a thick fluorescent sample, revealing details of the specimen's inner structure.

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