Open AccessLine scan - structured illumination microscopy super-resolution imaging in thick fluorescent samples
Author(s) -
Ondřej Mandula,
Martin Kielhorn,
Kai Wicker,
Gerhard Krampert,
Ingo Kleppe,
Rainer Heintzmann
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.024167
Subject(s) - optics , microscopy , light sheet fluorescence microscopy , materials science , fluorescence , resolution (logic) , fluorescence microscope , focus (optics) , fluorescence lifetime imaging microscopy , image resolution , physics , artificial intelligence , computer science
Structured illumination microscopy in thick fluorescent samples is a challenging task. The out-of-focus fluorescence background deteriorates the illumination pattern and the reconstructed images suffer from influence of noise. We present a combination of structured illumination microscopy with line scanning. This technique reduces the out-of-focus fluorescence background, which improves the modulation and the quality of the illumination pattern and therefore facilitates the reconstruction. We present super-resolution, optically sectioned images of a thick fluorescent sample, revealing details of the specimen's inner structure.