Echelle grating silicon multi/demultiplexers with single-reflection total internal reflectors | Zendy

Sahnggi Park | Zendy; SangGi Kim | Zendy; Jeagyu Park | Zendy; Gyungock Kim | Zendy

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Echelle grating silicon multi/demultiplexers with single-reflection total internal reflectors

Author(s) -

Sahnggi Park,

SangGi Kim,

Jeagyu Park,

Gyungock Kim

Publication year - 2012

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.20.023582

Subject(s) - optics , grating , total internal reflection , diffraction grating , crosstalk , materials science , silicon , reflector (photography) , silicon on insulator , reflection (computer programming) , physics , optoelectronics , light source , computer science , programming language

We present a silicon-on-insulator Echelle grating 8-channel demutiplexer showing characteristic features, average insertion loss 2.4 dB measured at 1520~1570 nm, adjacent channel crosstalk 15-18 dB, and channel spacing 11.9 nm. Our Echelle grating is remarked by a total internal reflector (TIR) which reflects incident light by a single reflection in contrast to the double reflections of retro-reflector TIR Echelle gratings.

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