Open AccessEchelle grating silicon multi/demultiplexers with single-reflection total internal reflectors
Author(s) -
Sahnggi Park,
SangGi Kim,
Jeagyu Park,
Gyungock Kim
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.023582
Subject(s) - optics , grating , total internal reflection , diffraction grating , crosstalk , materials science , silicon , reflector (photography) , silicon on insulator , reflection (computer programming) , physics , optoelectronics , light source , computer science , programming language
We present a silicon-on-insulator Echelle grating 8-channel demutiplexer showing characteristic features, average insertion loss 2.4 dB measured at 1520~1570 nm, adjacent channel crosstalk 15-18 dB, and channel spacing 11.9 nm. Our Echelle grating is remarked by a total internal reflector (TIR) which reflects incident light by a single reflection in contrast to the double reflections of retro-reflector TIR Echelle gratings.