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Ultra-compact, high-Q silicon microdisk reflectors
Author(s) -
Wei Shi,
Han Yun,
Wen Zhang,
Cheng-Ju Lin,
Ting Kai Chang,
Yun Wang,
Nicolas A. F. Jaeger,
Lukas Chrostowski
Publication year - 2012
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.021840
Subject(s) - resonator , optics , footprint , free spectral range , q factor , optoelectronics , wavelength , photonics , materials science , waveguide , radius , silicon , physics , paleontology , computer security , computer science , biology
We demonstrate wavelength-selective reflectors based on silicon microdisk resonators integrated with compact Y-branch splitters, using a CMOS-photonics technology. A high quality factor (Q) of ~ 88,000 was measured in the reflection spectrum for a 2.5-μm-radius device with a small footprint of 6 × 17 μm(2) and a wide free-spectral range (FSR) of over 41 nm. As the radius is reduced to 1.5 μm, corresponding to a device footprint of 4 × 15 μm(2), the spectrum shows an ultra-wide FSR of over 71 nm with the compromise of having a reduced Q of ~ 4000. The coupling between a microdisk and a waveguide is numerically investigated. We further propose a multichannel sensing system using cascaded microdisk reflectors.