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LCoS nematic SLM characterization and modeling for diffraction efficiency optimization, zero and ghost orders suppression
Author(s) -
Emiliano Ronzitti,
Marc Guillon,
Vincent de Sars,
Valentina Emiliani
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.017843
Subject(s) - optics , spatial light modulator , wavefront , diffraction , materials science , liquid crystal , diffraction efficiency , spatial filter , spatial frequency , fourier transform , liquid crystal on silicon , laser , light intensity , fourier optics , physics , quantum mechanics
Pixilated spatial light modulators are efficient devices to shape the wavefront of a laser beam or to perform Fourier optical filtering. When conjugated with the back focal plane of a microscope objective, they allow an efficient redistribution of laser light energy. These intensity patterns are usually polluted by undesired spots so-called ghosts and zero-orders whose intensities depend on displayed patterns. In this work, we propose a model to account for these discrepancies and demonstrate the possibility to efficiently reduce the intensity of the zero-order up to 95%, the intensity of the ghost up to 96% and increase diffraction efficiency up to 44%. Our model suggests physical cross-talk between pixels and thus, filtering of addressed high spatial frequencies. The method implementation relies on simple preliminary characterization of the SLM and can be computed a priori with any phase profile. The performance of this method is demonstrated employing a Hamamatsu LCoS SLM X10468-02 with two-photon excitation of fluorescent Rhodamine layers.

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