Open AccessBi-frequency correlation properties of the scattered intensity from dielectric rough surfaces
Author(s) -
Geng Zhang,
Zhensen Wu
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.014833
Subject(s) - optics , specular reflection , correlation function (quantum field theory) , gaussian , refractive index , physics , coherence (philosophical gambling strategy) , intensity (physics) , root mean square , scalar (mathematics) , surface finish , surface roughness , dielectric , mathematics , materials science , geometry , quantum mechanics , composite material
The analytical expression for the Bi-frequency correlation function of the intensity scattered from two-dimensional dielectric randomly rough surfaces obeying Gaussian distribution are presented based on the scalar Kirchhoff approximation theory with the root-mean-square (rms) slope of the surface less than 0.25 and the Gaussian moment theorem. The results show that the bi-frequency correlation properties of the scattered intensity closely depend on the incident and scattered conditions as well as on the statistical parameters and complex refractive index of the surface. Especially, the correlation function mainly comes from the specular direction, and the coherence bandwidth and the function decrease with the increase of the roughness of the rough surface. In addition, comparing with the real part, the imagery of the complex refractive index has a greater impact on the bi-frequency correlation function.