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New sub-diffraction-limit microscopy technique: Dual-point illumination AND-gate microscopy on nanodiamonds (DIAMOND)
Author(s) -
Jiwoong Kwon,
Youn Hee Lim,
JiWon Jung,
Seong Keun Kim
Publication year - 2012
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.013347
Subject(s) - optics , diffraction , microscopy , nanodiamond , point spread function , materials science , diamond , optical microscope , wavelength , optoelectronics , physics , scanning electron microscope , composite material
We introduce a new, easily implementable sub-diffraction-limit microscopy technique utilizing the optical AND-gate property of fluorescent nanodiamond (FND). We demonstrate that when FND is illuminated by two spatially-offset lights of different wavelengths, emission comes only from the region of their overlap, which is used to reduce the effective point spread function from ~300 nm to ~130 nm in lateral plane, well below the diffraction limit.

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