Open AccessWork function shifts of catalytic metals under hydrogen gas visualized by terahertz chemical microscopy
Author(s) -
Toshihiko Kiwa,
Takafumi Hagiwara,
Mitsuhiro Shinomiya,
Kenji Sakai,
Keiji Tsukada
Publication year - 2012
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.20.011637
Subject(s) - terahertz radiation , work function , materials science , catalysis , hydrogen , microscopy , electrode , kelvin probe force microscope , sapphire , optics , optoelectronics , nanotechnology , analytical chemistry (journal) , layer (electronics) , chemistry , atomic force microscopy , laser , chromatography , biochemistry , physics , organic chemistry
Terahertz chemical microscopy (TCM) was applied to visualize the distribution of the work function shift of catalytic metals under hydrogen gas. TCM measures the chemical potential on the surface of a SiO(2)/Si/sapphire sensing plate without any contact with the plate. By controlling the bias voltage between an electrode on the SiO(2)/ surface and the Si layer, the relationship between the voltage and the THz amplitude from the sensing plate can be obtained. As a demonstration, two types of structures were fabricated on the sensing plate, and the work function shifts due to catalytic reactions were visualized.